Leakage and Drive Characteristics of Planar 22-nm Partially-Depleted Silicon-on-Insulator and 14-nm Bulk and Quasi-Silicon-on-Insulator FinFET Devices King, Michael P.; Silva, Antoinette I.; DiGregorio, Steven D.; Rice, William C.; Massey, J.G.; Cannon, E.H.; Ballast, J.B.; Cabanas-Holmen, M.C.; Oldgies, P.O.; Rodbell, K.P.; Draper, Bruce L. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance King, Michael P.; Wu, X.Q.; Eller, M.E.; Samavedam, S.S.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Draper, Bruce L.; Rice, William C.; Meisenheimer, Timothy L.; Zhang, E.Z.; Haeffner, T.D.; Ball, D.R.; Shetler, K.J.; Alles, M.L.; Kauppila, J.S.; Massengill, Lloyd W. Abstract not provided. More Details TYPE Conference Poster YEAR 2016 OSTIDOI
Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors Hughart, David R.; Marshall, Michael T.; McLain, Michael L.; Marinella, Matthew J.; Lohn, Andrew L.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Bielejec, Edward S. Abstract not provided. More Details TYPE Presentation YEAR 2013 OSTI
Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors Hughart, David R.; Marshall, Michael T.; McLain, Michael L.; Marinella, Matthew J.; Lohn, Andrew L.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Bielejec, Edward S. Abstract not provided. More Details TYPE Conference YEAR 2013 OSTI