Non-Destructive Material Identification via Spectral X-Ray Data
Abstract not provided.
Publications
Leveraging multi-channel x-ray detector technology to improve quality metrics for industrial and security applications
Proceedings of SPIE - The International Society for Optical Engineering
Sandia National Laboratories has recently developed the capability to acquire multi-channel radio- graphs for multiple research and development applications in industry and security. This capability allows for the acquisition of x-ray radiographs or sinogram data to be acquired at up to 300 keV with up to 128 channels per pixel. This work will investigate whether multiple quality metrics for computed tomography can actually benefit from binned projection data compared to traditionally acquired grayscale sinogram data. Features and metrics to be evaluated include the ability to dis- tinguish between two different materials with similar absorption properties, artifact reduction, and signal-to-noise for both raw data and reconstructed volumetric data. The impact of this technology to non-destructive evaluation, national security, and industry is wide-ranging and has to potential to improve upon many inspection methods such as dual-energy methods, material identification, object segmentation, and computer vision on radiographs.
2 Results