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X-ray powder diffraction data for rhombohedral AlPt

Rodriguez, Mark A.; Adams, David P.

X-ray powder diffraction data for a rhombohedral AlPt phase formed by self-propagating, high-temperature reactions of AlPt bi-layer films are reported. Multilayer AlPt thin film samples, reacted in air or vacuum, transformed into rhombohedral AlPt with space group R-3(148). Indexing and lattice parameter refinement of AlPt powders (generated from thin-film samples) yielded trigonal/hexagonal unit-cell lattice parameters of a=15.623(6) Å and c=5.305(2) Å, Z=39, and V=1121.5 Å3. © International Centre for Diffraction Data.