Publications
What's been happening with the IVAs?
The working of induced voltage alteration (IVA) techniques and its major developments in areas of hardware for analysis, electrical biasing, detection advances, resolution improvements, and future possibilities, is discussed. IVA technique uses either a scanning electron microscope's (SEM) electron beam or a scanning optical microscope's (SOM) laser beam as the external stimulus. The other IVA techniques were developed using different localized stimuli, with the same sensitive biasing approach. The IVA techniques takes advantage of the strong signal response of CMOS devices when operated as current-to-voltage converters. To improve the biasing approach, externally induced voltage alterations (XIVA) was introduced, in which an ac choke circuit acts as a constant-voltage source. Synchronization with device operation also allows specific vectors to be analyzed using local photocurrent and thermal stimulus.