Using MRED to Screen Multiple Node Charge Collection Mitigated SOI Layouts
Black, Jeffrey B.; Dame, Jeff A.; Black, Dolores A.; Dodd, Paul E.; Shaneyfelt, Marty R.; Teifel, John T.; Salas, Joseph G.; Steinbach, Robert S.; Davis, Matthew M.; Reed, Robert R.; Weller, Robert W.; Trippe, James M.; Warren, Kevin W.; Tonigan, Andrew M.; Schrimpf, Ronald D.; Marquez, Richard S.
Abstract not provided.