Publications

Understanding Electrothermal Instability Growth by Comparing Z-Pinches with Engineered Defects to 3D-MHD Simulations

Awe, Thomas J.; Yu, E.P.Y.; Hutchinson, T.M.H.; Bauer, B.S.B.; Hatch, M.W.H.; Shipley, G.A.S.; Hutsel , B.T.H.

Abstract not provided.