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Tunable Nitride Josephson Junctions

Missert, Nancy A.; Henry, Michael D.; Lewis, Rupert; Howell, Stephen W.; Wolfley, Steven L.; Brunke, Lyle B.; Wolak, Matthaeus W.

We have developed an ambient temperature, SiO2/Si wafer - scale process for Josephson junctions based on Nb electrodes and Ta x N barriers with tunable electronic properties. The films are fabricated by magnetron sputtering. The electronic properties of the TaxN barriers are controlled by adjusting the nitrogen flow during sputtering. This technology offers a scalable alternative to the more traditional junctions based on AlOx barriers for low - power, high - performance computing.