Publications

Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks

King, Michael P.; Piedra, D.P.; Dickerson, Jeramy R.; Dasgupta, S.D.; Sun, M.S.; Marinella, Matthew J.; Palacios, T.P.; Kaplar, Robert K.

Abstract not provided.