Publications

Trapping Characteristics and Parametric Shifts in Lateral GaN HEMTs with SiO2/AlGaN Gate Stacks

King, Michael P.; Dickerson, Jeramy R.; DasGupta, Sandeepan D.; Marinella, Matthew J.; Kaplar, Robert K.; Piedra, D.P.; Sun, M.S.; Palacios, T.P.

Abstract not provided.