Publications
Towards a disorder model for the Si/SiO2 interface
Baczewski, Andrew D.; Witzel, Wayne W.; Jacobson, Noah T.; Jock, Ryan M.; Sharma, Peter A.; Vudatha, Rohith V.; Ward, Daniel R.; Carroll, Malcolm
Abstract not provided.
Baczewski, Andrew D.; Witzel, Wayne W.; Jacobson, Noah T.; Jock, Ryan M.; Sharma, Peter A.; Vudatha, Rohith V.; Ward, Daniel R.; Carroll, Malcolm
Abstract not provided.