TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices
King, Michael P.; Massey, Greg M.; Silva, A S.; Cannon, EH C.; Shaneyfelt, Marty R.; Loveless, TD L.; Ballast, J.B.; Cabanas-Holmen, M C.; DiGregorio, Steven D.; Rice, William C.; Draper, Bruce L.; Oldgies, P O.; Rodbell, K R.
Abstract not provided.