Publications

Thermal-stress effects on enhanced low-dose-rate sensitivity of linear bipolar circuits

Shaneyfelt, Marty R.; Schwank, James R.; Witczak, Steven C.; Riewe, Leonard C.; Winokur, Peter S.; Hash, Gerald L.

Thermal-stress effects are shown to have a significant impact on the enhanced low-dose-rate sensitivity of linear bipolar circuits. Implications of these results on hardness assurance testing and mechanisms are discussed.