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The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics

Reu, Phillip L.

As engineering challenges grow in the ever-shrinking world of nano-design, methods of making dynamic measurements of nano-materials and systems become more important. The Doppler electron velocimeter (DEV) is a new measurement concept motivated by the increasing importance of nano-dynamics. Nano-dynamics is defined in this context as any phenomenon that causes a dynamically changing phase in an electron beam, and includes traditional mechanical motion, as well as additional phenomena including changing magnetic and electric fields. The DEV is only a theoretical device at this point. Lastly, this article highlights the importance of pursuing nano-dynamics and presents a case that the electron microscope and its associated optics are a viable test bed to develop this new measurement tool.