Switching Reliability Characterization of Vertical GaN PiN Diodes
Slobodyan, Oleksiy S.; Sandoval, Stephanie S.; Flicker, Jack D.; Kaplar, Robert K.; matthews, christopher m.; Van Heukelom, Michael V.; Atcitty, Stanley A.; Kizilyalli, Isik C.; Aktas, Ozgur A.
Abstract not provided.