Publications

Suppression of electron emission from metal electrodes : LDRD 28771 final report

Fowler, William E.; Ives, Harry C.; Savage, Mark E.; Stygar, William A.

This research consisted of testing surface treatment processes for stainless steel and aluminum for the purpose of suppressing electron emission over large surface areas to improve the pulsed high voltage hold-off capabilities of these metals. Improvements to hold-off would be beneficial to the operation of the vacuum-insulator grading rings and final self-magnetically insulated transmission line on the ZR-upgrade machine and other pulsed power applications such as flash radiograph and pulsed-microwave machines. The treatments tested for stainless steel include the Z-protocol (chemical polish, HVFF, and gold coating), pulsed E-beam surface treatments by IHCE, Russia, and chromium oxide coatings. Treatments for aluminum were anodized and polymer coatings. Breakdown thresholds also were measured for a range of surface finishes and gap distances. The study found that: (1.) Electrical conditioning and solvent cleaning in a filtered air environment each improve HV hold-off 30%. (2.) Anodized coatings on aluminum give a factor of two improvement in high voltage hold-off. However, anodized aluminum loses this improvement when the damage is severe. Chromium oxide coatings on stainless steel give a 40% and 20% improvement in hold-off before and after damage from many arcs. (3.) Bare aluminum gives similar hold-off for surface roughness, R{sub a}, ranging from 0.08 to 3.2 {micro}m. (4.) The various EBEST surfaces tested give high voltage hold-off a factor of two better than typical machined and similar to R{sub a} = 0.05 {micro}m polished stainless steel surfaces. (5.) For gaps > 2 mm the hold-off voltage increases as the square root of the gap for bare metal surfaces. This is inconsistent with the accepted model for metals that involves E-field induced electron emission from dielectric inclusions. Micro-particles accelerated across the gap during the voltage pulse give the observed voltage dependence. However the similarity in observed breakdown times for large and small gaps places a requirement that the particles be of molecular size. This makes accelerated micro-particle induced breakdown seem improbable also.