Publications

Sub-surface imaging of atomically-thin semiconductors beneath dielectrics based on optical standing wave using photoelectron emission microscopy with deep-ultraviolet photoexcitation

Ohta, Taisuke O.; Berg, Morgann B.; Liu, Angeline F.; Smith, Sean M.; Copeland, Robert G.; Chan, Calvin C.; Mohite, A.D.; Beechem, T.E.

Abstract not provided.