Publications
Structure within thin epoxy films revealed by solvent swelling: A neutron reflectivity study
The focus of this work is the structure within highly crosslinked, two component epoxy films. The authors examine variations in crosslink density within thin epoxy films on silicon substrates by solvent swelling. The method is based on the fact that the equilibrium volume fraction of a swelling solvent is strongly dependent upon the local crosslink density. The authors examine the volume fraction profile of the good solvent nitrobenzene through the epoxy films by neutron reflection. Isotopic substitution is used to provide contrast between the epoxy matrix and the swelling solvent.