Publications

Single-event upset and snapback in silicon-on-insulator devices

Dodd, Paul E.; Shaneyfelt, Marty R.; Schwank, James R.; Hash, Gerald L.; Draper, Bruce L.; Winokur, Peter S.

SEU is studied in SOI transistors and circuits with various body tie structures. The importance of impact ionization effects, including single-event snapback, is explored. Implications for hardness assurance testing of SOI integrated circuits are discussed.