Publications

Single Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure

Wang, Peng W.; Sternberg, Andrew S.; Sierawski, Brian D.; Zhang, En X.; Tonigan, A.M.&.; Brewer, Rachel M.; Dodds, Nathaniel A.; Vizkelethy, Gyorgy V.; Jordan, Scott L.; Fleetwood, Daniel M.; Reed, Robert R.; Schrimpf, Ronald D.

Abstract not provided.