Single Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure
Wang, Peng W.; Sternberg, Andrew S.; Sierawski, Brian D.; Zhang, En X.;
Tonigan, A.M.&.; Brewer, Rachel M.; Dodds, Nathaniel A.; Vizkelethy, Gyorgy V.;
Jordan, Scott L.; Fleetwood, Daniel M.; Reed, Robert R.; Schrimpf, Ronald D.
Abstract not provided.