Publications

Single-event characterization of the 20 nm Xilinx Kintex UltraScale field-programmable gate array under heavy ion irradiation

Lee, David S.; Allen, Gregory R.; Swift, Gary; Cannon, Matthew; Wirthlin, Michael; George, Jeffrey S.; Koga, Rokutaro; Huey, Kangsen

This study examines the single-event response of the Xilinx 20 nm Kintex UltraScale Field-Programmable Gate Array irradiated with heavy ions. Results for single-event latch-up and single-event upset on configuration SRAM cells and Block RAM memories are provided.