Publications

Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation

Lee, David S.; Allen, Gregory R.; Swift, Gary S.; Cannon, Matthew C.; Wirthlin, Michael J.; George, Jeffrey S.; Koga, Rokutaro K.; Huey, Kangsen H.

Abstract not provided.