Publications

Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation

Lee, David S.; King, Michael P.; Evans, William L.; Rice, William C.; Wirthlin, Michael J.; Cannon, Matthew C.; perez-celis, andres p.; Anderson, Jordan A.

Abstract not provided.