Publications

Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation

Lee, David S.; King, Michael P.; Evans, William L.; Cannon, Matthew; Perez-Celis, Andres; Anderson, Jordan; Wirthlin, Michael; Rice, William C.

This study examines the single-event response of Xilinx 16nm FinFET UltraScale+ FPGA and MPSoC device families. Heavy-ion single-event latch-up, single-event upsets in configuration SRAM, BlockRAM™ memories, and flip-flops, and neutron-induced single-event latch-up results are provided.