Publications

Publications / Conference Poster

Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation

Lee, David S.; King, Michael P.; Evans, William L.; Cannon, Matthew C.; perez-celis, andres p.; Anderson, Jordan A.; Wirthlin, Michael J.; Rice, William C.

Abstract not provided.