Publications

RF read-out of minority carrier lifetimes in micro-scale infrared materials

Dev, S.; Wang, Y.; Kim, K.; Zamiri, M.; Kadlec, Clark N.; Goldflam, Michael G.; Hawkins, Samuel D.; Shaner, Eric A.; Kim, Jin K.; Krishna, S.; Allen, M.; Allen, J.; Tutuc, E.; Wasserman, D.

We present micro-scale time-resolved microwave resonator response (μ-TRMRR), a sensitive technique capable of measuring carrier lifetimes in micron-scale materials, something not typically achievable using common techniques like time-resolved photoluminescence or time-resolved microwave reflectance.