Publications

Publications / Presentation

Reliability Studies of Wide-Bandgap Power Semiconductor Devices Under Realistic Stress Conditions

Kaplar, Robert K.; Flicker, Jack D.; Slobodyan, Oleksiy S.; Mueller, Jacob M.; Garcia Rodriguez, Luciano A.; Binder, Andrew B.; Dickerson, Jeramy R.; Smith, Trevor S.; Atcitty, Stanley A.

Abstract not provided.