Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors
Hughart, David R.; Marshall, Michael T.; McLain, Michael L.; Marinella, Matthew J.; Lohn, Andrew L.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Bielejec, Edward S.
Abstract not provided.