Progress and Challenges in Developing a Reliable Embedded ReRAM Memory for Hostile Environments
Marinella, Matthew J.; Hughart, David R.; Stevens, James E.; Mickel, Patrick R.; Haase, Gad S.; Decker, Seth D.; Apodaca, Roger A.; Bielejec, Edward S.; Vizkelethy, Gyorgy V.; McLain, Michael L.
Abstract not provided.