Publications

Probing limits of STM field emission patterned Si:P $\delta$-doped devices

Rudolph, Martin R.; Carr, Stephen M.; Subramania, Ganapathi S.; Ten Eyck, Gregory A.; Dominguez, Jason J.; Pluym, Tammy P.; Lilly, Michael L.; Carroll, Malcolm; Bussmann, Ezra B.

Abstract not provided.