Publications
Predicting Fracture in Micron-Scale Polycrystalline Silicon MEMS Structures
Reedy, Earl D.; Boyce, Brad B.; Foulk, James W.; Field, Richard V.; Ohlhausen, J.A.
Abstract not provided.
Reedy, Earl D.; Boyce, Brad B.; Foulk, James W.; Field, Richard V.; Ohlhausen, J.A.
Abstract not provided.