Publications

Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference

Dodds, Nathaniel A.; Dodds, Nathaniel A.; Schwank, James R.; Schwank, James R.; Shaneyfelt, Marty R.; Shaneyfelt, Marty R.; Dodd, Paul E.; Dodd, Paul E.; Doyle, Barney L.; Doyle, Barney L.; Trinczek, M.C.; Trinczek, M.C.; Blackmore, E.W.; Blackmore, E.W.; Rodbell, K.P.; Rodbell, K.P.; Reed, R.A.; Reed, R.A.; Pellish, J.A.; Pellish, J.A.; LaBel, K.A.; LaBel, K.A.; Marshall, P.W.; Marshall, P.W.; Swanson, Scot E.; Swanson, Scot E.; Vizkelethy, Gyorgy V.; Vizkelethy, Gyorgy V.; Van Deusen, Stuart B.; Van Deusen, Stuart B.; Sexton, Frederick W.; Sexton, Frederick W.; Martinez, Marino M.; Martinez, Marino M.

The recipients of the 2014 NSREC Outstanding Conference Paper Award are Nathaniel A. Dodds, James R. Schwank, Marty R. Shaneyfelt, Paul E. Dodd, Barney L. Doyle, Michael Trinczek, Ewart W. Blackmore, Kenneth P. Rodbell, Michael S. Gordon, Robert A. Reed, Jonathan A. Pellish, Kenneth A. LaBel, Paul W. Marshall, Scot E. Swanson, Gyorgy Vizkelethy, Stuart Van Deusen, Frederick W. Sexton, and M. John Martinez, for their paper entitled "Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam." For older CMOS technologies, protons could only cause single-event effects (SEEs) through nuclear interactions. Numerous recent studies on 90 nm and newer CMOS technologies have shown that protons can also cause SEEs through direct ionization. Furthermore, this paper develops and demonstrates an accurate and practical method for predicting the error rate caused by proton direct ionization (PDI).