On-Wafer Microfabricated Test Structures for Characterizing RF Breakdown in Narrow Gaps
Ruyack, Alexander R.; Jordan, Matthew J.; Moore, Christopher M.; Hummel, Gwendolyn H.; Herrera, Sergio A.; Ballance, Mark H.; Bingham, Andrew J.; Schiess, Adrian R.; Gibson, Christopher B.; Nordquist, Christopher N.
Abstract not provided.