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Measurement and Modeling of Single Event Transients in 12nm Inverters

Agarwal, Sapan A.; Clark, Lawrence T.; YoungSciortino, Clifford Y.; Ng, Garrick N.; Black, Dolores A.; Cannon, Matthew J.; Black, Jeffrey B.; Quinn, Heather; Barnaby, Hugh J.; Brunhaver, John S.; Marinella, Matthew J.

Abstract not provided.