Publications

Layer-dependent measurements of electronic band alignment for individual MoS2 flakes supported on SiO2 using photoemission electron microscopy (PEEM) with deep ultraviolet illumination

Berg, Morgann B.; Ohta, Taisuke O.; Chan, Calvin C.; Keyshar, Kunttal K.; Mohite, Aditya D.; Bilgin, Ismail B.; Liu, Fangze L.; Yamaguchi, Hisato Y.; Vajtai, Robert V.; Gupta, Gautam G.; Kar, Swastik K.; Ajayan, Pulickel A.

Abstract not provided.