Layer-Dependent Band Alignment of MoS2 WS2 and MoSe2 Flakes on SiO2 Measured by Photoemission Electron Microscopy
Berg, Morgann B.; Ohta, Taisuke O.; Chan, Calvin C.; Keyshar, Kunttal K.; Mohite, Aditya D.; Bilgin, Ismail B.; Liu, Fangze L.; Yamaguchi, Hisato Y.; Vajtai, Robert V.; Gupta, Gautam G.; Kar, Swastik K.; Ajayan, Pulickel A.
Abstract not provided.