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Irradiation-induced creep in metallic nanolaminates characterized by In situ TEM pillar nanocompression

Dillon, Shen J.; Bufford, Daniel C.; Jawaharram, Gowtham S.; Liu, Xuying; Lear, Calvin; Hattar, Khalid M.; Averback, Robert S.

This work reports on irradiation-induced creep (IIC) measured on nanolaminate (Cu-W and Ni-Ag) and nanocrystalline alloys (Cu-W) at room temperature using a combination of heavy ion irradiation and nanopillar compression performed concurrently in situ in a transmission electron microscope. Appreciable IIC is observed in multilayers with 50 nm layer thicknesses at high stress, ≈½ the yield strength, but not in multilayers with only 5 nm layer thicknesses.