Publications

Investigation of deep levels in high-breakdown-voltage low-threading-dislocation-density vertical GaN P-i-N diodes

King, Michael P.; Kaplar, Robert K.; Wierer, Jonathan W.; Moseley, Michael; Kizilyalli, I.C.; Bour, D.P.; Aktas, O.A.; Nie, H.N.; Disney, D.D.; Allerman, A.A.; Armstrong, Andrew A.

Abstract not provided.