Publications

Hygrothermal degradation of (3-glycidoxypropyl)trimethoxysilane films studied by neutron and X-ray reflectivity and attenuated total reflection infrared spectroscopy

Yim, Hyun Y.; Kent, Michael S.; Tallant, David T.; Garcia, Manuel J.; Majewski, J.

The chemical and structural changes within thin films of (3-glycidoxypropyl)trimethoxysilane (GPS) after exposure for various periods of time to air saturated with either D 2O or H 2O at 80°C were studied. The X-ray and neutron reflectivity (XR and NR), combined wuth attenuated total reflection infrared (ATR-IR) spectroscopy were used. The chemical degradation mechanism was identified by IR as hydrolysis of siloxane bonds. GPS films were prepared by dip-coating, which resulted in a greater and more variable thickness than for the spin-coated samples, for ATR-IR. The little changes in the reflectivity data was observed for films conditioned with D 2O at 80°C for one month.