Publications
Historical Examination of the ASTM Standard E722 1-MeV Silicon Equivalent Fluence Metric
ASTM Committee E10 on Nuclear Technology and Applications develops and maintains many standards that are relevant to the radiation metrology activities in Sandia National Laboratories' Radiation and Electrical Sciences Center. This is particularly true for the reactor facilities and Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices. In the past decade, Subcommittee E10.07 has been making substantive changes to the standard widely used to assess radiation hardness to neutron effects in electronics, E722 – Standard Practice for Characterking Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics. ASTM Standard E722 describes the method that defines the 1-MeV silicon and the 1-MeV gallium arsenide equivalent fluence radiation damage metrics. An evaluation of the impact of changes to the shape of the 1-MeV silicon equivalent fluence radiation damage metric from the 1985 version (E722-85) to the most recent version (E722-19) is performed.