Publications
High-g shock test results of Tadiran TLM-1530MP cells
In April of 2009, testing was done of a high-g instrumentation device that utilized Tadiran TLM-1530MP cells as a power source. As a result of that testing, it was determined that those cells exhibit failure more often when shocked in the axial direction. No failures over many tests where found when the cells were shocked laterally. Moreover, when shocked laterally, the cells exhibited no observable degradation in performance. We looked at the failed cells via non-destructive x-ray analysis to determine what internal structures failed.