Publications

Heavy Ion Displacement Damage Effects in 14nm-Process FinFETs

Esposito, Madeline G.; Manuel, Jack E.; Bielejec, Edward S.; Dickerson, Jeramy R.; Kerber, Pranita K.; King, Michael P.; Talin, A.A.; Ashby, David; McLain, Michael L.; Marinella, Matthew J.

Abstract not provided.