Publications

Extending in situ X-ray Temperature Diagnostics to Internal Components

Halls, Benjamin R.; Henkelis, Susan E.; Lowry, Daniel R.; Rademacher, David R.

Time-resolved X-ray thermometry is an enabling technology for measuring temperature and phase change of components. However, current diagnostic methods are limited in their ability due to the invasive nature of probes or the requirement of coatings and optical access to the component. Our proposed developments overcome these challenges by utilizing X-rays to directly measure the objects temperature. Variable-Temperature X-ray Diffraction (VT-XRD) was performed over a wide range of temperatures and diffraction angles and was performed on several materials to analyze the patterns of the bulk materials for sensitivity. "High-speed" VT-XRD was then performed for a single material over a small range of diffraction angles to see how fast the experiments could be performed, whilst still maintaining peaks sufficiently large enough for analysis.