Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies
Privat, A.P.; Barnaby, H.B.; Spear, M.S.; Esposito, Madeline G.; Manuel, Jack E.; Clark, Lawrence T.; Brunhaver, J.B.; A., Duvnjak A.; Jokai, R.J.; Holbert, K.E.; McLain, Michael L.; Marinella, Matthew J.; King, Michael P.
Abstract not provided.