Publications

Effects of low-fluence helium plasma exposure characterized by helium ion microscopy scanning probes and in-situ ellipsometry

Kolasinski, Robert K.; Dasgupta, Dwaipayan D.; Wong, Chun-Shang W.; Friddle, Raymond W.; Engel, Aaron E.; Buchenauer, D.A.; Maroudas, Dimitrios M.; Wirth, Brian W.

Abstract not provided.