Publications

Effect of Flux on the Defects and Electrical Behavior in Si Devices irradiated with He Ions

Aguirre, Brandon A.; Vizkelethy, Gyorgy V.; Vaandrager, Bastiaan L.; Martin, William J.; Seidl, P.S.; Persaud, A.P.; Ji, Q.J.; Ludewigt, B.A.; Schenkel, T.S.; Bielejec, Edward S.

Abstract not provided.