Publications

Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors

Hughart, David R.; Marshall, Michael T.; McLain, Michael L.; Marinella, Matthew J.; Lohn, Andrew L.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Bielejec, Edward S.

Abstract not provided.