Publications

Diagnosis of factors impacting yield in multilayer devices for superconducting electronics

Missert, Nancy A.; Jenkins, Mark W.; Tangyunyong, Paiboon T.; Mook, William M.; Vernik, I.V.; Kirichenko, A.F.; Mukhanov, O.A.; Wynn, A.W.; Day, A.L.; Bolkhovsky, V.B.; Johnson, L.J.

Abstract not provided.