Publications

Determination of background doping type in type-II superlattice using capacitance-voltage measurements with double mesa structure

Fink, D.R.; Lee, S.C.; Kodati, S.H.; Rogers, V.R.; Ronningen, T.J.; Winslow, M.W.; Grein, C.H.; Jones, A.H.; Campbell, J.C.; Klem, John F.; Krishna, S.K.

Abstract not provided.