Defect Investigation of Regrown Vertical GaN p-n Diodes Using Deep-Level Optical Spectroscopy
Pickrell, Gregory P.; Armstrong, Andrew A.; Allerman, A.A.; Crawford, Mary H.; feezell, d f.; Monavarian, M M.; Aragon, A.AA.; Talin, A.A.; Leonard, Francois L.; Celio, Kimberlee C.; Glaser, Caleb E.; Kempisty, Jeffrey M.; Abate, Vincent M.
Abstract not provided.