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Correlation Between Co-60 and X-Ray Radiation-Induced Charge Buildup in Silicon-on-Insulator Buried Oxides

Schwank, James R.; Witczak, Steven C.; Riewe, Leonard C.; Shaneyfelt, Marty R.; Shaneyfelt, Marty R.; Dodd, Paul E.; Jones, Rhonda L.; Draper, Bruce L.

Abstract not provided.